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In-Situ TEM Investigation of Controlled VLS Silicon Nanowire Device Formation and Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S5 / November 2016
- Published online by Cambridge University Press:
- 21 December 2016, pp. 60-61
- Print publication:
- November 2016
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Building and Imaging Silicide Nanostructures in Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1505-1506
- Print publication:
- August 2015
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